The Materials characterization and testing lab is equipped with the most advanced characterization and testing instruments in the field of compound semiconductor epitaxy, which can comprehensively test and evaluate the electrical, optical, structural, and morphological properties of epitaxial films. The established measuring methods include crystal quality testing, surface defect inspection, square resistance measurement, step height measurement, material reflectance, doping concentration, mobility, and photoluminescence characterization. The lab will be established as an open, highly-effective, and resource-sharing platform to provide characterization and test services. In addition, the lab will provide consultation and training services for the research institute and the enterprises around Zhangjiagang city.